Project Description

OVERVIEW

X-ray diffraction (XRD) technique is one of the most important tools for materials characterization. XRD carries the information directly from the atomic arrangement of the phases present. An X-Ray Diffractometer collects interference patterns reflecting from lattice structures by varying the angle of incidence and the detector.

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Specifications

  • 1kW operating voltage
  • High intensity parallel Ka beam
  • 2θ Angular range: <1 to >150
  • High acuracy in peak positions: ≤01 º2θ

Make and Model of the equipment: Bruker D8 Advance

The Bruker D8 ADVANCE, DIFFRAC.SUITE and DIFFRAC.EVA software support simple execution of common powder and thin film XRD methods. The information can be extract is;

  • Phase identification and indexing (Crystalline phases), Determination of sample purity
  • Quantitative analysis (Phase percentage in multi-phase mixtures and amount of amorphous content)
  • Microstructure analysis (crystallite size)
  • Bulk residual stress analysis in manufactured components
  • Texture (preferred orientation) analysis
  • Indexing, ab-initio crystal structure determination and crystal structure refinement

Type of samples:

Both Powder and Film

Charges

  • Rs 500/- per sample for Industry
  • Rs 250/- per sample for academics

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