Atomic Force Microscope (AFM)

SPECIFICATION

• High-resolution imaging in both air and fluid — 120 μm XY range and 15 μm Z
• Supports large samples up to 80 mm dia
• Vertical resolution: 0.5 nm
• Lateral resolution: Depends on tip radius (2 nm to 10 nm)
• Supports most AFM imaging Modes
• Standard modes which comes with system
  • Tapping mode/AC mode
  • Phase imaging
  • Contact mode
  • Roughness measurement
  • Particle Analysis

Applications

(a) The evaluation of interactions between a specific atom and its neighbouring  atoms .

(b) Surface roughness and surface potential .

(c) AFM can be used to study the structure and mechanical properties of protein complexes and assemblies.

CHARGES

Internal Sample Rs 150.00

External Sample Rs 500.00

Industry Sample Rs 1000.00

Faculty In-Charge

Prof. Spandan Guha, SME

spandan.guhafme@kiit.ac.in

(M) 87776 01029