Frequently asked questions.

Frequently asked questions.

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Specification

  • High-resolution scanning probe microscopy (sub-nanometer resolution)
  • Multiple imaging modes: Contact Mode, Non-Contact Mode, Tapping Mode
  • XYZ Piezoelectric scanner for precise nanoscale positioning
  • Lateral resolution: Depends on tip radius(2nm to10 nm)
  • Vertical (Z) resolution: ~0.5 nm
  • Scan size: up to 120 µm × 120 µm (XY range) and 15 µm Z range
  • Integrated vibration isolation system
  • Optical microscope for sample positioning
  • Advanced software for image acquisition and analysis
  • Force spectroscopy capability
  • Phase and amplitude imaging