AFM is an advanced nanoscale characterization technique used to analyze surface morphology, structure, and material properties with extremely high resolution.

Key Applications:

Materials Study

• Surface morphology and topography analysis
• Nanoparticles size and distribution study
• Thin film characterization
• Grain structure and surface defects analysis
• Nanomaterials (Graphene, CNTs, GO, etc.)

Materials Testing

• Surface roughness measurement (Ra, Rq, RMS)
• Mechanical property analysis (stiffness, elasticity, adhesion)
• Phase imaging for material contrast
• Agglomeration and dispersion analysis
• Coating and layer thickness evaluation

Process & Research Applications

• Polymer and composite analysis
• Tribology and wear surface study
• Semiconductor surface characterization
• Biomaterials and vesicle analysis
• Failure analysis at nanoscale