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Model Overview.
The RENISHAW InVia Raman Microscope is a high-resolution, non-destructive analytical instrument used to identify materials through molecular vibrational fingerprints. It supports advanced research in materials science, chemistry, nanotechnology, biology, and forensic sciences.

Model Details.
High-performance confocal Raman microscope for molecular and structural characterization
- Spectral Resolution (FWHM): 0.5 cm⁻¹
- Raman Spectral Range: 50–4000 cm⁻¹
- Spectrometer Range: 200–2000 nm
- High sensitivity CCD detector for weak Raman signal detection
- Non-destructive and non-contact analysis
Laser Sources Available:
- 325 nm UV Laser — 25 mW
- 532 nm Green Laser — 100 mW
- 633 nm Red Laser — 17 mW
- 785 nm Near-IR Laser — 300 mW
Microscope Objectives:
- 5× Objective
- 20× Objective
- 50× Objective
- 100× Objective
- NUV 15× Objective
- NUV 40× Objective
Sample Stage & Mapping:
- Automated high-speed XYZ mapping sample stage
- Optically encoded feedback-controlled stage
- 50 nm encoder resolution
- Confocal depth profiling with 8 nm step size
- Supports point analysis, line mapping, area mapping, and 3D depth profiling
- Micro-Raman spectrometer with Leica microscope
- Four excitation sources (325, 532, 633, 785 nm)
- Ultra-low cut-off filter for low-frequency Raman (~10 cm⁻¹)
- Motorized neutral density filters with 16 power levels
Raman microscopy is widely used for phase identification, chemical identification, and molecular structure characterization across geological, physical, chemical, biological, and forensic sciences.
Key Applications:
- Geological Sciences
- Physical & Material Sciences
- Chemical Sciences
- Biological Sciences
- Forensic Sciences
- Confocal depth profiling with 0.1 µm step size
- Long working distance objectives for liquid sampling
- Macro sampling kit for liquid samples
- High temperature cell for in-situ measurements (RT to 1500°C)
Analysis Capability:
- Point Analysis
- Line Scan
- 2D Chemical Mapping
- 3D Depth Profiling
- Stress / Strain Analysis
- Crystallographic Orientation Analysis
