SPECIFICATION
- High-resolution imaging in both air and fluid — 120 μm XY range and 15 μm Z
- Supports large samples up to 80 mm dia
- Vertical resolution: 0.5 nm
- Lateral resolution: Depends on tip radius (2 nm to 10 nm)
- Supports most AFM imaging Modes
- Standard modes which comes with system
- Tapping mode/AC mode
- Phase imaging
- Contact mode
- Roughness measurement
- Particle Analysis
Applications
(a) The evaluation of interactions between a specific atom and its neighbouring atoms .
(b) Surface roughness and surface potential .
(c) AFM can be used to study the structure and mechanical properties of protein complexes and assemblies.
